C14041-10U is an InGaAs camera with high sensitivity in the infrared range of 950 nm to 1700 nm. This camera has a USB 3.0 interface port and supports 14 bit image acquisition and exposure time adjustment. This makes it suitable for various infrared applications, such as internal inspection of silicon chips and devices, laser beam alignment, solar cell evaluation, and more.
characteristic
● High sensitivity in the near-infrared region
Resolution: 320 × 256 pixels
Low noise and high stability, with refrigeration
High quality rolling shutter mode and global shutter mode, capable of simultaneously exposing the entire installed screen
The frame rate is approximately 216 frames per second (in rolling shutter mode)
purpose
Internal inspection of silicon wafers and equipment
● Solar cell evaluation
Evaluation and analysis of optical communication equipment
EL/PL image acquisition
detailed parameters
PRODUCT MODEL | C14041-10U |
Detector Type | InGaAs sensor |
Effective Pixels | 320 (H)×256 (V) |
pixel size | 20 μm × 20 μm |
Effective area | 6.4 mm (H) × 5.12 mm (V) |
Reading speed |
216.6 frames per second (rolling shutter) 214.3 frames per second (global shutter speed) |
Readout Noise |
4.6 ms to 1 s (rolling shutter)* 100 μ s to 1 s (global shutter)* |
Cooling method | Peltier refrigeration |
Refrigeration temperature | +10 Moh C (forced air cooling, ambient temperature+25 Moh C) |
External trigger mode | Edge trigger, level trigger, start trigger |
External trigger signal path | SMA |
Trigger delay | 0 to 1 s (10 μ s step size) |
Image processing function | Background subtraction, shadow correction |
interface | USB 3.0 |
connector | USB 3.0 MicroB type |
A/D converter | 14 positions |
Lens Mount | C-type interface |
power supply | DC+12V |
power consumption | Approximately 16 W |
Operating temperature | 0 Moh C to+40 Moh C* |
Environmental storage temperature | -10 Moh C to+50 Moh C |
Environmental working humidity | 30% to 80% (non condensing) |
Environmental storage humidity | Up to 90% (no condensation) |
*Depending on the exposure time or ambient temperature, pixels may be brighter or darker than the surrounding area, or the image may be uneven. This is caused by the characteristics of nGaAs sensors, not defects or malfunctions of the camera.Equivalent to USB 3.1 Gen I.
Spectral sensitivity characteristics
size
Quantum efficiency curve
1550nm spot imaging